#  Introduction to Micro Spot XRF for Trace Elemental Analysis of Nanoparticles, Thin Films and Mettalomics 

 



####  calendar\_today Date and Time 

 **September 24, 2014** 

 12:00PM - 02:00PM EDT 

####  pin\_drop Location 

 **LISE Room 303**  



 

 



 

Energy Dispersive X-ray Flourescence Spectroscopy To register, please visit: [www.cns.fas.harvard.edu/about/news\_events.phpCNS](http://www.cns.fas.harvard.edu/about/news_events.phpCNS) Special Event:  
Energy Dispersive X-ray Fluorescence Spectroscopy is a widely accepted technique in the research areas of geology, metals, and petrochemical analysis. With the advent of Micro Spot X-ray tubes and optics, ED-XRF based techniques can now be used in areas that require ultra low detection  
limits and small spot analysis. In this presentation, Mike Beauchaine will discuss the use of TXRF (Total Reflection X-ray Fluorescence) for trace  
elemental analysis using only micrograms of sample for nanoparticles and biological research. He will also present research within materials analysis  
using small spot Micro XRF spectroscopy. Lastly, Mike Beauchaine will introduce you to the brand new large scale Micro XRF technology for the  
analysis of hidden paintings under famous works of art.  
  
September 24, 2014  
12:00 P.M. – 2:00 P.M.  
Seminar  
@  
LISE, Room 303

2:00 P.M. – 5:00 P.M.  
TXRF Demo  
@  
LISE, Room G27

INTRODUCTION TO MICRO SPOT XRF FOR TRACE ELEMENTAL ANALYSIS OF NANOPARTICLES, THIN FILMS, AND METTALOMICS

Event Open To All Users

Lunch Will Be Provided For Registered Attendees  
Get The Details And Register:  
[www.cns.fas.harvard.edu/about/news\_events.php](http://www.cns.fas.harvard.edu/about/news_events.php)  
Questions?  
Contact H. Greg Lin:  
<hlin@cns.fas.harvard.edu>



 

 



 

 

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