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X-WR-CALNAME;VALUE=TEXT:Scott Speakman
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SUMMARY:Scott Speakman
DESCRIPTION:<p><a href="http://prism.mit.edu/xray/speakman.htm" data-url="http://prism.mit.edu/xray/speakman.htm">Dr. Scott Speakman</a>, a XRD Principal Scientist, T<em>hin Film Analysis by X-Ray Scattering Techniques.  </em>This lecture is offered as part of Chem 255.  Free and open to the public.<!--break--></p><p>Abstract: Many advances in materials science are currently being driven by the development of thin film technology.  As a consequence, the types and complexity of thin films that a researcher by encounter has greatly increased.  This lecture will present an overview of the X-ray scattering techniques that can be used to study thin films and guidance on how to select the most effective techniques for studying various thin films.  I will include examples from some of the most challenging thin films that I have encountered and share the tricks that were used to successfully collect data from those films.</p>
LOCATION:Pfizer Lecture Hall
STATUS:CONFIRMED
DTSTART:20140313T180000Z
DTEND:20140313T193000Z
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