Scott Speakman
Date and Time
Location
Dr. Scott Speakman, a XRD Principal Scientist, Thin Film Analysis by X-Ray Scattering Techniques. This lecture is offered as part of Chem 255. Free and open to the public.
Abstract: Many advances in materials science are currently being driven by the development of thin film technology. As a consequence, the types and complexity of thin films that a researcher by encounter has greatly increased. This lecture will present an overview of the X-ray scattering techniques that can be used to study thin films and guidance on how to select the most effective techniques for studying various thin films. I will include examples from some of the most challenging thin films that I have encountered and share the tricks that were used to successfully collect data from those films.